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Showing results 1 to 8 of 8

1 Conference Paper A unified approach for the reliability modeling of MOSFETs Chang-Ki Baek ; SeongWook Choi ; Hong-Hyun Park ; et al 2008-09-10
2 Conference Paper Noise simulation in nanoscale devices based on the non-equilibrium Green’s function formalism Hong-Hyun Park ; HONG, SUNG MIN ; Seonghoon Jin ; et al 2007-09-25
3 Conference Paper Noise simulation of mesoscopic device based on the non-equilibrium Green’s function formalism Hong-Hyun Park ; HONG, SUNG MIN ; Seonghoon Jin ; et al 2008-02-01
4 Conference Paper Oxide-trapping model for physics-based 1/f noise analysis in MOSFETs HONG, SUNG MIN ; Jun-Myung Woo ; Hong-Hyun Park ; et al 2008-02-01
5 Conference Paper Physics-based simulation of 1/f noise in MOSFETs under large-signal operation HONG, SUNG MIN ; Hong-Hyun Park ; Chan Hyeong Park ; et al 2009-09-26
6 Conference Paper Reliability studies on non planar DRAM cell transistor Myoung Jin Lee ; Seonghoon Jin ; Chang-Ki Baek ; et al 2007-04-15
7 Conference Paper Reliability studies on non planar DRAM cell transistor Myoung Jin Lee ; Seonghoon Jin ; Chang-Ki Baek ; et al 2007-02-01
8 Conference Paper Statistical analysis of random telegraph noise in CMOS image sensors Jun-Myung Woo ; Hong-Hyun Park ; Hong Shick Min ; et al 2008-09-10

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