OAK

GIST Library Login
Search

GIST Scholar College of Information and Computing Department of Electrical Engineering and Computer Science 2. Conference Papers

A unified approach for the reliability modeling of MOSFETs

Metadata Downloads
Author(s)
Chang-Ki Baek; SeongWook Choi; Hong-Hyun Park; Jun-Myung Woo; Young June Park; HONG, SUNG MIN; Chan Hyeong Park
Type
Conference Paper
Citation
International Conference on Simulation of Semiconductor Processes and Devices, pp.61 - 64
Issued Date
2008-09-10
Publisher
International Conference on Simulation of Semiconductor Processes and Devices
Conference Place
JA
URI
https://scholar.gist.ac.kr/handle/local/26211
Authorize & License
  • Authorize공개
Files in This Item:

  • There are no files associated with this item.

qrcode

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.

GIST Scholar was built as a Argonet.