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Reliability studies on non planar DRAM cell transistor

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Author(s)
Myoung Jin LeeSeonghoon JinChang-Ki BaekHONG, SUNG MINSoo-Young ParkHong-Hyun ParkSang-Don LeeSung-Woong ChungJae-Goan JeongSung-Joo HongSung-Wook ParkIn-Young ChungYoung June ParkHong Shick Min
Type
Conference Paper
Citation
한국반도체학술대회, pp.0
Issued Date
2007-02-01
Publisher
한국반도체
Conference Place
KO
URI
https://scholar.gist.ac.kr/handle/local/27114
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