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GIST Scholar College of Information and Computing Department of Electrical Engineering and Computer Science 2. Conference Papers

Statistical analysis of random telegraph noise in CMOS image sensors

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Author(s)
Jun-Myung Woo; Hong-Hyun Park; Hong Shick Min; Young June Park; HONG, SUNG MIN; Chan Hyeong Park
Type
Conference Paper
Citation
International Conference on Simulation of Semiconductor Processes and Devices, pp.77 - 80
Issued Date
2008-09-10
Publisher
Browse Conferences
Conference Place
JA
URI
https://scholar.gist.ac.kr/handle/local/26212
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