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GIST Scholar College of Artificial Intelligence Department of Electrical Engineering and Computer Science 2. Conference Papers

Reliability studies on non planar DRAM cell transistor

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Author(s)
Myoung Jin Lee; Seonghoon Jin; Chang-Ki Baek; HONG, SUNG MIN; Soo-Young Park; Hong-Hyun Park; Sang-Don Lee; Sung-Woong Chung; Jae-Goan Jeong; Sung-Joo Hong; Sung-Wook Park; In-Young Chung; Young June Park; Hong Shick Min
Type
Conference Paper
Citation
International Reliability Physics Symposium
Issued Date
2007-04-15
Publisher
International Reliability Physics Symposium
Conference Place
US
URI
https://scholar.gist.ac.kr/handle/local/27029
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