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GIST Scholar College of Engineering Department of Materials Science and Engineering

2. Conference Papers2,129

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1601 Conference Paper Integration of Dual Metal Gate CMOS with TaSiN and Ru Gate Electrodes on HfO2 Gate Dielectrics 이병훈 2005-06-01
1602 Conference Paper Systematic investigation of amorphous transition-metal-silicon-nitride electrodes for metal gate CMOS applications 이병훈 2005-06-01
1603 Conference Paper p-Type ZnO and LED Applications 박성주 2005-05-31
1604 Conference Paper Self-assembled growth and characterization of Si quantum dots for Si nano-devices 박성주 2005-05-21
1605 Conference Paper Challenges in the High-k Dielectric Implementation for 45nm Technology Node 이병훈 2005-05-01
1606 Conference Paper Evaluation and Integration of Metal Gate Electrodes for Future Generation Dual Metal CMOS 이병훈 2005-05-01
1607 Conference Paper Organic donor/acceptor photovoltaic device based on perylene and viologen Kim, S ; 고흥조 ; Choi, W ; et al 2005-04-22
1608 Conference Paper Fabrication and Application of TiO2 Nanostructures using Surface Relief Gratings on Polymer Films 김동유 2005-04-22
1609 Conference Paper Multi or high contrast ratio electrochromic Lim, J. Y ; 고흥조 ; Lee, H 2005-04-22
1610 Conference Paper Optical and electrical properties of Si quantum dot 박성주 2005-04-22
1611 Conference Paper Multi-electrochromism of conducting polymers with chromophore pendants 고흥조 ; Moon, B ; Lee, H 2005-04-22
1612 Conference Paper photoactive azobenzene polymer for optical fabrication of supramolecular helix grating patterns 김동유 2005-04-05
1613 Conference Paper Well-Controlled Polymeric Nanocapsules using LCs as hydrophobes from Moniemulsion Polymerization 이재석 2005-04-01
1614 Conference Paper Growth mechanism study of ALD-TiN and the thickness dependence of its work function 이병훈 2005-04-01
1615 Conference Paper Impact of Plasma Induced Damage on PMOSFETs with Hf-silicate and TiN Gate 이병훈 2005-04-01
1616 Conference Paper Effect of High-k Post-Deposition Cleaning in Improving CMOS Bias Instabilities and Mobility: A Potential Issue in Reliability of Dual Metal Gate Techn 이병훈 2005-04-01
1617 Conference Paper Interfacial Layer Dependence of HfSixOy Gate Stacks on Vt Instability and Charge Trapping Using Ultra-Short Pulse I-V Characterization 이병훈 2005-04-01
1618 Conference Paper Comparison of hot carrier stress and constant voltage stress in Hf-silicate NMOS transistors with Poly and TiN gate stack 이병훈 2005-04-01
1619 Conference Paper Dominant SILC mechanisms in TiN/HfO2 gate NMOS and PMOS transistors 이병훈 2005-04-01
1620 Conference Paper Comparison of NMOS and PMOS stress for determining the source of NBTI in TiN/HfSiON devices 이병훈 2005-04-01

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