OAK

GIST Library Login
Search

GIST Scholar College of Engineering Department of Materials Science and Engineering 2. Conference Papers

Transient charging effects and its implication to the reliability of high-k dielectrics

Metadata Downloads
Author(s)
이병훈
Type
Conference Paper
Issued Date
2005-09-01
URI
https://scholar.gist.ac.kr/handle/local/27945
Authorize & License
  • Authorize공개
Files in This Item:

  • There are no files associated with this item.

qrcode

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.

GIST Scholar was built as a Argonet.