위상 검출 방식 레이저 스캐너의 APD bias 전압 특성을 이용한 검출신호세기 제어 방법

Abstract

In the phase-shift measurement method, the distance light travels can be obtained based on the phase difference between the reference signal and the measured signal. When the object having various colors is measured, the intensity of the measured signal much varies even at the same distance, and it causes different phase delay due to wide dynamic range input to a signal processing circuit. In this work, an measured intensity control method is proposed to solve this phase delay problem.