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Time-Resolved Ultraviolet Near-Field Scanning Optical Microscope for Characterizing Photoluminescence Lifetime of Light-Emitting Devices

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Author(s)
Park, Kyoung-Duck; Jeong, Hyun; Kim, Yong Hwan; Yim, Sang-Youp; Lee, Hong Seok; Suh, Eun-Kyung; Jeong, Mun Seok
Type
Article
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.13, no.3, pp.1798 - 1801
Issued Date
2013-03
Abstract
We developed a instrument consisting of an ultraviolet (UV) near-field scanning optical microscope (NSOM) combined with time-correlated single photon counting, which allows efficient observation of temporal dynamics of near-field photoluminescence (PL) down to the sub-wavelength scale. The developed time-resolved UV NSOM system showed a spatial resolution of 110 nm and a temporal resolution of 130 ps in the optical signal. The proposed microscope system was successfully demonstrated by characterizing the near-field PL lifetime of InGaN/GaN multiple quantum wells.
Publisher
American Scientific Publishers
ISSN
1533-4880
DOI
10.1166/jnn.2013.6992
URI
https://scholar.gist.ac.kr/handle/local/15638
Appears in Collections:
Research Institutes > 1. Journal Articles
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