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Size-controlled InGaN/GaN nanorod array fabrication and optical characterization

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Abstract
We demonstrate a cost-effective top-down approach for fabricating InGaN/GaN nanorod arrays using a wet treatment process in a KOH solution. The average diameter of the as-etched nanorods was effectively reduced from 420 nm to 180 nm. The spatial strain distribution was then investigated by measuring the high-resolution cathodoluminescence directly on top of the nanorods. The smaller nanorods showed a higher internal quantum efficiency and lower potential fluctuation, which can subsequently be exploited for high-efficiency photonic devices. (C) 2013 Optical Society of America
Author(s)
Bae, Si-YoungKong, Duk-JoLee, Jun-YeobSeo, Dong-JuLee, Dong-Seon
Issued Date
2013-07
Type
Article
DOI
10.1364/OE.21.016854
URI
https://scholar.gist.ac.kr/handle/local/15498
Publisher
Optical Society of America
Citation
Optics Express, v.21, no.14, pp.16854 - 16862
ISSN
1094-4087
Appears in Collections:
Department of Semiconductor Engineering > 1. Journal Articles
Research Institutes > 1. Journal Articles
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