Size-controlled InGaN/GaN nanorod array fabrication and optical characterization
- Abstract
- We demonstrate a cost-effective top-down approach for fabricating InGaN/GaN nanorod arrays using a wet treatment process in a KOH solution. The average diameter of the as-etched nanorods was effectively reduced from 420 nm to 180 nm. The spatial strain distribution was then investigated by measuring the high-resolution cathodoluminescence directly on top of the nanorods. The smaller nanorods showed a higher internal quantum efficiency and lower potential fluctuation, which can subsequently be exploited for high-efficiency photonic devices. (C) 2013 Optical Society of America
- Author(s)
- Bae, Si-Young; Kong, Duk-Jo; Lee, Jun-Yeob; Seo, Dong-Ju; Lee, Dong-Seon
- Issued Date
- 2013-07
- Type
- Article
- DOI
- 10.1364/OE.21.016854
- URI
- https://scholar.gist.ac.kr/handle/local/15498
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