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Independence of elemental intensity ratio on plasma property during laser-induced breakdown spectroscopy

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Author(s)
Kim, Chan-KyuIn, Jung-HwanLee, Seok-HeeJeong, Sungho
Type
Article
Citation
OPTICS LETTERS, v.38, no.16, pp.3032 - 3035
Issued Date
2013-08
Abstract
The authors report that the elemental composition ratio of Ga to In in a CuIn1-xGaxSe2 compound semiconductor, a thin-film solar cell material, can be measured with little influence of plasma property changes by laser-induced breakdown spectroscopy (lambda = 1064 nm, tau = 5 ns). It is shown that the similarity in excitation energy levels of the selected Ga and In emission lines and the fact that these elements belong to the same group of the periodic table are the critical factors ensuring the independence of intensity ratio on plasma conditions. (C) 2013 Optical Society of America
Publisher
Optical Society of America
ISSN
0146-9592
DOI
10.1364/OL.38.003032
URI
https://scholar.gist.ac.kr/handle/local/15475
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