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Distribution of THz electric field in the split-ring resonator metamaterials based on the thin film geometry

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Abstract
We investigate THz response of split-ring resonator prepared on the polyimide film grown on the Si substrate. We observe a strong thickness dependence of the resonance frequency which is attributed to the change in the effective dielectric constant. From the finite-difference time-domain simulation, we reproduce experimental results, and find large variations of the electric field profile depending on the polyimide thickness. We discuss the optimal film configuration to achieve the large enhancement of THz electric field which depends strongly on thicknesses and optical constants of constituent layers. © 2015 Elsevier B.V. All rights reserved.
Author(s)
Seo, J.H.Kim, T.H.Kang, ChulKee, Chul-SikLee, Jong Seok
Issued Date
2016-03
Type
Article
DOI
10.1016/j.cap.2015.12.018
URI
https://scholar.gist.ac.kr/handle/local/14315
Publisher
Elsevier
Citation
CURRENT APPLIED PHYSICS, v.16, no.3, pp.329 - 334
ISSN
1567-1739
Appears in Collections:
Department of Physics and Photon Science > 1. Journal Articles
Research Institutes > 1. Journal Articles
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