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Strong emission of THz radiation from GaAs microstructures on Si

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Abstract
Remarkably strong emission of terahertz radiation from illuminated GaAs microstructures on a Si substrate is reported. The peak-to-peak amplitude of terahertz radiation from the sample is 9 times larger than that of THz radiation from a semi-insulating GaAs wafer. The spectral width of the sample is larger than that of a semi-insulating GaAs wafer; in particular, the spectral amplitude increases at higher frequencies. The presented GaAs microstructures on a Si substrate can be suitable for practical and efficient THz sources required in various THz applications. (C) 2018 Author(s).
Author(s)
Maeng, InheeLee, GyuseokKang, ChulJu, Gun WuPark, KwangwookSon, Seoung-BumLee, Yong-TakKee, Chul-Sik
Issued Date
2018-12
Type
Article
DOI
10.1063/1.5079668
URI
https://scholar.gist.ac.kr/handle/local/12954
Publisher
American Institute of Physics Inc.
Citation
AIP Advances, v.8, no.12
ISSN
2158-3226
Appears in Collections:
Department of Electrical Engineering and Computer Science > 1. Journal Articles
Research Institutes > 1. Journal Articles
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