Strong emission of THz radiation from GaAs microstructures on Si
- Abstract
- Remarkably strong emission of terahertz radiation from illuminated GaAs microstructures on a Si substrate is reported. The peak-to-peak amplitude of terahertz radiation from the sample is 9 times larger than that of THz radiation from a semi-insulating GaAs wafer. The spectral width of the sample is larger than that of a semi-insulating GaAs wafer; in particular, the spectral amplitude increases at higher frequencies. The presented GaAs microstructures on a Si substrate can be suitable for practical and efficient THz sources required in various THz applications. (C) 2018 Author(s).
- Author(s)
- Maeng, Inhee; Lee, Gyuseok; Kang, Chul; Ju, Gun Wu; Park, Kwangwook; Son, Seoung-Bum; Lee, Yong-Tak; Kee, Chul-Sik
- Issued Date
- 2018-12
- Type
- Article
- DOI
- 10.1063/1.5079668
- URI
- https://scholar.gist.ac.kr/handle/local/12954
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