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Resonant X-ray emission spectroscopy using self-seeded hard X-ray pulses at PAL-XFEL

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Abstract
Self-seeded hard X-ray pulses at PAL-XFEL were used to commission a resonant X-ray emission spectroscopy experiment with a von Hamos spectrometer. The self-seeded beam, generated through forward Bragg diffraction of the [202] peak in a 100 mu m-thick diamond crystal, exhibited an average bandwidth of 0.54 eV at 11.223 keV. A coordinated scanning scheme of electron bunch energy, diamond crystal angle and silicon monochromator allowed us to map the Ir L beta 2 X-ray emission lines of IrO2 powder across the Ir L 3-absorption edge, from 11.212 to 11.242 keV with an energy step of 0.3 eV. This work provides a reference for hard X-ray emission spectroscopy experiments utilizing self-seeded pulses with a narrow bandwidth, eventually applicable for pump-probe studies in solid-state and diluted systems.
Author(s)
Choi, Tae-KyuPark, JaekuKim, GyujinJang, HoyoungPark, Sang-YounSohn, Jang HyeobCho, Byoung IckKim, HyunjungKim, Kyung SookNam, InhyukChun, Sae Hwan
Issued Date
2023-11
Type
Article
DOI
10.1107/S1600577523007312
URI
https://scholar.gist.ac.kr/handle/local/9912
Publisher
INT UNION CRYSTALLOGRAPHY
Citation
JOURNAL OF SYNCHROTRON RADIATION, v.30, no.PART 6, pp.1038 - 1047
ISSN
0909-0495
Appears in Collections:
Department of Physics and Photon Science > 1. Journal Articles
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