Resonant X-ray emission spectroscopy using self-seeded hard X-ray pulses at PAL-XFEL
- Abstract
- Self-seeded hard X-ray pulses at PAL-XFEL were used to commission a resonant X-ray emission spectroscopy experiment with a von Hamos spectrometer. The self-seeded beam, generated through forward Bragg diffraction of the [202] peak in a 100 mu m-thick diamond crystal, exhibited an average bandwidth of 0.54 eV at 11.223 keV. A coordinated scanning scheme of electron bunch energy, diamond crystal angle and silicon monochromator allowed us to map the Ir L beta 2 X-ray emission lines of IrO2 powder across the Ir L 3-absorption edge, from 11.212 to 11.242 keV with an energy step of 0.3 eV. This work provides a reference for hard X-ray emission spectroscopy experiments utilizing self-seeded pulses with a narrow bandwidth, eventually applicable for pump-probe studies in solid-state and diluted systems.
- Author(s)
- Choi, Tae-Kyu; Park, Jaeku; Kim, Gyujin; Jang, Hoyoung; Park, Sang-Youn; Sohn, Jang Hyeob; Cho, Byoung Ick; Kim, Hyunjung; Kim, Kyung Sook; Nam, Inhyuk; Chun, Sae Hwan
- Issued Date
- 2023-11
- Type
- Article
- DOI
- 10.1107/S1600577523007312
- URI
- https://scholar.gist.ac.kr/handle/local/9912
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