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Intensity-Product-Based Optical Sensing to Beat the Diffraction Limit in an Interferometer

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Abstract
The classically defined minimum uncertainty of the optical phase is known as the standard quantum limit or shot-noise limit (SNL), originating in the uncertainty principle of quantum mechanics. Based on the SNL, the phase sensitivity is inversely proportional to (Formula presented.), where K is the number of interfering photons or statistically measured events. Thus, using a high-power laser is advantageous to enhance sensitivity due to the (Formula presented.) gain in the signal-to-noise ratio. In a typical interferometer, however, the resolution remains in the diffraction limit of the K = 1 case unless the interfering photons are resolved as in quantum sensing. Here, a projection measurement method in quantum sensing is adapted for classical sensing to achieve an additional (Formula presented.) gain in the resolution. To understand the projection measurements, several types of conventional interferometers based on N-wave interference are coherently analyzed as a classical reference and numerically compared with the proposed method. As a result, the Kth-order intensity product applied to the N-wave spectrometer exceeds the diffraction limit in classical sensing and the Heisenberg limit in quantum sensing, where the classical N-slit system inherently satisfies the Heisenberg limit of (Formula presented.) in resolution. © 2024 by the author.
Author(s)
Ham, Byoung S.
Issued Date
2024-08
Type
Article
DOI
10.3390/s24155041
URI
https://scholar.gist.ac.kr/handle/local/9410
Publisher
Multidisciplinary Digital Publishing Institute (MDPI)
Citation
Sensors, v.24, no.15
ISSN
1424-3210
Appears in Collections:
Department of Electrical Engineering and Computer Science > 1. Journal Articles
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