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Mobility calculation of nanosheet transistors at cryogenic temperatures: Impact of nanosheet cross-section and channel strain

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Author(s)
Hong, Sung-MinJang, Geon-Tae
Type
Conference Paper
Citation
Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices
Issued Date
2018-07-03
Publisher
Electronic Society, The Institute of Electronics, Information and Communications Engineers
Conference Place
JA
URI
https://scholar.gist.ac.kr/handle/local/8491
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