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Negative Fermi-level Pinning Effect Observed in Metal/GaAs Junction with Graphene Insertion Layer

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Author(s)
Yoon, Hoon Hahn
Issued Date
2018-11-10
Type
Conference Paper
URI
https://scholar.gist.ac.kr/handle/local/8315
Publisher
National Research Foundation of Korea
Citation
2018 Global Ph.D. Fellows Symposium
Conference Place
KO
Incheon
Appears in Collections:
Department of Semiconductor Engineering > 2. Conference Papers
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