OAK

Negative Fermi-level Pinning Effect Observed in Metal/GaAs Junction with Graphene Insertion Layer

Metadata Downloads
Author(s)
Yoon, Hoon Hahn
Type
Conference Paper
Citation
2018 Global Ph.D. Fellows Symposium
Issued Date
2018-11-10
Publisher
National Research Foundation of Korea
Conference Place
KO
Incheon
URI
https://scholar.gist.ac.kr/handle/local/8315
Authorize & License
  • Authorize공개
Files in This Item:
  • There are no files associated with this item.

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.