OAK

GIST Library
Search

GIST Scholar College of Information and Computing Department of Electrical Engineering and Computer Science 2. Conference Papers

Deep Learning based Phase Unwrapping for Precise 3D Surface Profiling in Holography

Metadata Downloads
Author(s)
Muhammad Awais; Lee, Byeong Ha; Yoon, Taeil; Kim, Younggue
Type
Conference Paper
Citation
20th World Conference on Non-Destructive Testing
Issued Date
2024-05-28
Publisher
ICNDT( the International Committee for Non-Destructive Testing)
Conference Place
KO
송도컨벤시아
URI
https://scholar.gist.ac.kr/handle/local/8206
Authorize & License
  • Authorize공개
Files in This Item:

  • There are no files associated with this item.

qrcode

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.

GIST Scholar was built as a Argonet.