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GIST Repository College of Information and Computing Department of Electrical Engineering and Computer Science 2. Conference Papers

Deep Learning based Phase Unwrapping for Precise 3D Surface Profiling in Holography

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Author(s)
Muhammad Awais; Lee, Byeong Ha; Yoon, Taeil; Kim, Younggue
Type
Conference Paper
Citation
20th World Conference on Non-Destructive Testing
Issued Date
2024-05-28
Publisher
ICNDT( the International Committee for Non-Destructive Testing)
Conference Place
KO
송도컨벤시아
URI
https://scholar.gist.ac.kr/handle/local/8206
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