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GIST Repository College of Information and Computing Department of Electrical Engineering and Computer Science 2. Conference Papers

Measurement of nanometer scale displacement by using the optical interferometer based on a 3x3 optical fiber coupler

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Author(s)
Lee, Byeong Ha; Kim, Younggue; Yoon, Taeil; Muhammad Awais
Issued Date
2024-05-28
Type
Conference Paper
URI
https://scholar.gist.ac.kr/handle/local/8204
Publisher
ICNDT( the International Committee for Non-Destructive Testing)
Citation
20th World Conference on Non-Destructive Testing
Conference Place
KO
송도컨벤시아
Appears in Collections:
Department of Electrical Engineering and Computer Science > 2. Conference Papers
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