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Miniaturized Spectral Sensing with a Tunable Optoelectronic Interface

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Abstract
Reconstructive optoelectronic spectroscopy has generated substantial interest in the miniaturization of traditional spectroscopic tools, such as spectrometers. However, most state-of-the-art demonstrations face fundamental limits of rank deficiency in the photoresponse matrix. In this work, we demonstrate a miniaturized spectral sensing system using an electrically tunable compact optoelectronic interface, which generates distinguishable photoresponses from various input spectra, enabling accurate spectral identification with a device footprint of 5 micrometers by 5 micrometers. We report narrow-band spectral sensing with peak accuracies of similar to 0.19 nanometers in free space and similar to 2.45 nanometers on-chip. In addition, we implement broadband complex spectral sensing for material identification, applicable to organic dyes, metals, semiconductors, and dielectrics. This work advances high-performance, miniaturized optical spectroscopy for both free-space and on-chip applications, offering cost-effective solutions, broad applicability, and scalable manufacturing.
Author(s)
Cui, XiaoqiNigmatulin, FedorWang, LeiReduto, IgorLiapis, Andreas C.Du, MingdeUddin, Md GiusMayeen, Shafi AbdeAhmed, FaisalZhang, YiYoon, Hoon HahnLipsanen, HarriHonkanen, SeppoAalto, TimoYang, ZongyinHasan, TawfiqueCai, WeiweiSun, Zhipei
Issued Date
2025-01
Type
Article
DOI
10.1126/sciadv.ado6886
URI
https://scholar.gist.ac.kr/handle/local/8045
Publisher
AMER ASSOC ADVANCEMENT SCIENCE
Citation
Science Advances, v.11, no.4
ISSN
2375-2548
Appears in Collections:
Department of Semiconductor Engineering > 1. Journal Articles
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