Dive into Soft Matter Imaging: Artificial Intelligence-Integrated Electron Microscopy
- Author(s)
- Yoon Junyeon; Hwang, Jun Ho; Lee, Eunji
- Type
- Article
- Citation
- NPG Asia Materials
- Issued Date
- 2025-12
- Abstract
- Hierarchical self-assembly in soft materials generates complex nanostructures with critical applications ranging from biomedicine to energy storage systems. Advanced transmission electron microscopy (TEM) methodologies—including cryogenic-TEM, electron tomography, and liquid-phase TEM—have significantly advanced our ability to visualize these assemblies with unprecedented spatiotemporal resolution. This perspective examines how machine learning integration overcomes inherent limitations in TEM analysis of beam-sensitive soft materials, enabling automated feature extraction, 3D reconstruction, and dynamic process analysis. We propose future directions for creating integrated analytical platforms that predict material properties from imaging data, accelerating the development of next-generation functional materials for extreme environments and emerging global challenges.
- Publisher
- Nature Portfolio
- ISSN
- 1884-4049
- DOI
- 10.1038/s41427-025-00629-0
- URI
- https://scholar.gist.ac.kr/handle/local/33533
- 공개 및 라이선스
-
- 파일 목록
-
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.