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Random Key Generation from Entropy-Constrained SRAM PUFs Using Fourier Analysis

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Author(s)
Hwang, Eui SeokYang, JaewonHan, Seungnam
Type
Conference Paper
Citation
2025 IEEE International Conference on Big Data, BigData 2025
Issued Date
2025-12-09
Publisher
Institute of Electrical and Electronics Engineers Inc.
Conference Place
CC
Galaxy International Convention Center
URI
https://scholar.gist.ac.kr/handle/local/33461
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