Characterization of a Johann-Type Crystal Spectrometer with Laser-Plasma X-ray Source

Abstract

The resolution of a Johann-type bent crystal spectrometer is measured with an oxygen k-alpha emission from a polyimide film irradiated by an ultra-intense laser pulse. To obtain sufficient waveband, the Johann spectrometer is constructed in de-focused mode geometry using a TlAP 001 cylindrically curved crystal. The resolution of the de-focused Johann spectrometer is measured as 1.20 eV considering the FWHM of the oxygen k-alpha emission and the Doppler broadening mechanism. The measured resolution 1.20 eV seems reasonable considering the TlAP bent crystal diffraction curve width( > 0.866 eV), which is a dominant factor in the spectrometer resolution.