Two-level system loss characterization of NbTi superconducting resonators on Si/SiO2 substrates
- Author(s)
- Kim, Bongkeon; Doh, Yong-joo
- Type
- Article
- Citation
- Current Applied Physics, v.80, pp.354 - 361
- Issued Date
- 2025-12
- Abstract
- Superconducting coplanar waveguide (SCPW) resonators, key components for quantum computing and sensing applications, require a high internal quality factor (Qi) for effective qubit readout and quantum sensing applications. Minimizing two-level system (TLS) losses, particularly at material interfaces, is critical for gatemon and topological qubits operating at low temperatures and in high magnetic fields. NbTi, a superconducting alloy with a high upper critical field, enables SCPW resonators resilient to such conditions. We fabricated NbTi SCPW resonators on Si/SiO2 substrates and systematically characterized their TLS-limited quality factors as functions of temperature and microwave photon number. Our results demonstrate that NbTi-based SCPWs on Si/SiO2 substrates provide a promising platform for developing next-generation quantum circuits. © 2025 Elsevier B.V., All rights reserved.
- Publisher
- Elsevier B.V.
- ISSN
- 1567-1739
- DOI
- 10.1016/j.cap.2025.10.010
- URI
- https://scholar.gist.ac.kr/handle/local/32297
- 공개 및 라이선스
-
- 파일 목록
-
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.