Quasi-1D Model for Bridging TCAD Simulation and Compact Modeling of Gate-All-Around MOSFETs
- Author(s)
- Lee, Kwang-woon; Hong, Sung-min
- Type
- Conference Paper
- Citation
- 1st International Compact Modeling Conference, ICMC 2025
- Issued Date
- 2025-06-27
- Abstract
- A quasi-1D model is an intermediate-level approach that solves the one-dimensional carrier continuity equation along the channel direction, together with the cross-sectional charge model. It offers significantly higher computational efficiency compared to the technology computer-aided design (TCAD) simulation, while accurately accounting for geometric effects. By bridging the TCAD simulation and the compact modeling, the quasi-1D model enables a seamless transition between these two fields. In this work, we present results of our quasi-1D model for gate-all-around MOSFETs. Starting with the cross-sectional charge model, we demonstrate the complete quasi-1D model results and their implications. © 2025 Elsevier B.V., All rights reserved.
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Conference Place
- US
San Francisco; CA
- URI
- https://scholar.gist.ac.kr/handle/local/32280
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