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Numerical Investigation of Electrical Performance and Scaling Properties in 6T1C IGZO-Based Synaptic Devices

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Author(s)
Kwon, Ye HanRoh, YoungchaeJoe, ChanghoonKim, SangBumHong, Sung-min
Type
Conference Paper
Citation
2025 Silicon Nanoelectronics Workshop, SNW 2025, pp.86 - 87
Issued Date
2025
Abstract
A 6T1C IGZO-based synaptic memory has excellent linearity, symmetry, and retention characteristics. In this work, we numerically investigate the performance of a 6T1C IGZO-based synaptic memory by examining leakage characteristics, synaptic behavior, and capacitance scaling. The impact of cell size reduction on retention characteristics is also evaluated. © 2025 Elsevier B.V., All rights reserved.
Publisher
Institute of Electrical and Electronics Engineers Inc.
Conference Place
Kyoto
URI
https://scholar.gist.ac.kr/handle/local/32043
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