Numerical Investigation of Electrical Performance and Scaling Properties in 6T1C IGZO-Based Synaptic Devices
- Author(s)
- Kwon, Ye Han; Roh, Youngchae; Joe, Changhoon; Kim, SangBum; Hong, Sung-min
- Type
- Conference Paper
- Citation
- 2025 Silicon Nanoelectronics Workshop, SNW 2025, pp.86 - 87
- Issued Date
- 2025
- Abstract
- A 6T1C IGZO-based synaptic memory has excellent linearity, symmetry, and retention characteristics. In this work, we numerically investigate the performance of a 6T1C IGZO-based synaptic memory by examining leakage characteristics, synaptic behavior, and capacitance scaling. The impact of cell size reduction on retention characteristics is also evaluated. © 2025 Elsevier B.V., All rights reserved.
- Publisher
- Institute of Electrical and Electronics Engineers Inc.
- Conference Place
- Kyoto
- URI
- https://scholar.gist.ac.kr/handle/local/32043
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