GIST Scholar
College of Engineering
Department of Materials Science and Engineering
2. Conference Papers
Effect of Barrier layer on the Electrical and Reliability Characteristics of High-k gate dielectric films
- Type
- Conference Paper
- Citation
- , pp.707 - 710
- Issued Date
- 1998-12-01
- Appears in Collections:
- Department of Materials Science and Engineering > 2. Conference Papers
- Files in This Item:
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