OAK

3D profilometry based on the white light interferometer for rough surfaces

Metadata Downloads
Author(s)
최태선
Type
Conference Paper
Citation
SIPE, pp.619 - 626
Issued Date
1999-11-01
Publisher
SPIE
Conference Place
US
URI
https://scholar.gist.ac.kr/handle/local/30382
Authorize & License
  • Authorize공개
Files in This Item:
  • There are no files associated with this item.

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.