OAK

GIST Library
Search

GIST Scholar College of Engineering Department of Materials Science and Engineering 2. Conference Papers

Ultrathin hafnium oxide with low leakage and excellent reliability for alternative gate dielectric applications

Metadata Downloads
Author(s)
이병훈
Type
Conference Paper
Citation
, pp.143 - 146
Issued Date
1999-12-01
URI
https://scholar.gist.ac.kr/handle/local/30351
Authorize & License
  • Authorize공개
Files in This Item:

  • There are no files associated with this item.

qrcode

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.

GIST Scholar was built as a Argonet.