OAK

Real-virtual transition in bulk GaAs: the thickness dependence', Young-Dahl Jho and Dai-Sik Kim, Proc.SPIE Int. Soc. Opt. Eng. 3940, 246 (2000)

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Author(s)
JHO, Young Dahl
Type
Conference Paper
Citation
SPIE, pp.246 - 251
Issued Date
2000-01-01
Publisher
SPIE DigitalLibrary.org/conference-proceedings-of-spie
Conference Place
US
URI
https://scholar.gist.ac.kr/handle/local/30272
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