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GIST Repository College of Information and Computing Department of Electrical Engineering and Computer Science 2. Conference Papers

Characteristic potential method of noise calculation in semiconductor devices: calculation of 1/f noise in MOS transistors in the ohmic region

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Author(s)
HONG, SUNG MIN; Yong-Seok Kim; Hong Shick Min; Young June Park
Type
Conference Paper
Citation
Noise in Devices and Circuits, pp.267 - 281
Issued Date
2003-06-03
Publisher
Noise in Devices and Circuits
Conference Place
US
URI
https://scholar.gist.ac.kr/handle/local/29109
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