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GIST Scholar College of Information and Computing Department of Electrical Engineering and Computer Science 2. Conference Papers

The physical and numerical implications of the noise modeling method: IFM, CPM, and ERS

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Author(s)
Hyunchul Nah; HONG, SUNG MIN; Young June Park; Hong Shick Min
Type
Conference Paper
Citation
International Conference on Simulation of Semiconductor Processes and Devices, pp.75 - 78
Issued Date
2003-09-04
Publisher
Browse Conferences
Conference Place
US
URI
https://scholar.gist.ac.kr/handle/local/29011
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