OAK

Soft X-ray Point Diffraction Interferometry using High Harmonics (invited)

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Author(s)
남창희
Type
Conference Paper
Citation
2nd Int. Symposium on Nanomanufacturing
Issued Date
2004-01-01
Conference Place
KO
Daejeon
URI
https://scholar.gist.ac.kr/handle/local/28859
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