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GIST Scholar College of Engineering Department of Materials Science and Engineering 2. Conference Papers

Localized transient charging and it’s implication on the hot carrier reliability of HfSiON MOSFETs

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Author(s)
이병훈
Type
Conference Paper
Citation
, pp.691 - 692
Issued Date
2004-04-01
URI
https://scholar.gist.ac.kr/handle/local/28732
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