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GIST Scholar College of Engineering Department of Materials Science and Engineering 2. Conference Papers

A Model for Negative Bias Temperature Instability (NBTI) in Oxide and High-k pFETs

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Author(s)
이병훈
Type
Conference Paper
Citation
, pp.208 - 209
Issued Date
2004-06-01
URI
https://scholar.gist.ac.kr/handle/local/28640
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