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GIST Scholar College of Engineering Department of Materials Science and Engineering 2. Conference Papers

rapping/de-trapping gate bias dependence of Hf-silicate dielectrics with poly and TiN gate electrode

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Author(s)
이병훈
Type
Conference Paper
Citation
, pp.214 - 215
Issued Date
2004-09-01
URI
https://scholar.gist.ac.kr/handle/local/28542
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