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A physics-based TCAD framework for the noise analysis of RF CMOS circuits under the large-signal operation

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Author(s)
HONG, SUNG MINRaseong KimHong Shick MinChan Hyeong Park
Type
Conference Paper
Citation
International Conference on Simulation of Semiconductor Processes and Devices, pp.119 - 122
Issued Date
2005-09-02
Publisher
International Conference
Conference Place
JA
URI
https://scholar.gist.ac.kr/handle/local/27942
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