OAK

GIST Library Login
Search

GIST Scholar College of Engineering Department of Materials Science and Engineering 2. Conference Papers

Intrinsic Threshold Voltage Instability of the HfO2 Gate Stack NMOS Transistor

Metadata Downloads
Author(s)
이병훈
Type
Conference Paper
Issued Date
2006-04-01
URI
https://scholar.gist.ac.kr/handle/local/27634
Authorize & License
  • Authorize공개
Files in This Item:

  • There are no files associated with this item.

qrcode

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.

GIST Scholar was built as a Argonet.