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GIST Scholar College of Engineering Department of Materials Science and Engineering 2. Conference Papers

Thermally Stable N-Metal Gate MOSFETs Using La-Incorporated HfSiO Dielectric

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Author(s)
이병훈
Type
Conference Paper
Citation
, pp.16 - 17
Issued Date
2006-06-01
URI
https://scholar.gist.ac.kr/handle/local/27505
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