GIST Scholar
College of Engineering
Department of Materials Science and Engineering
2. Conference Papers
Improved reliability of GaN-based light-emitting diode by selective wet etching of p-GaN
- Type
- Conference Paper
- Citation
- Spie Optics & Photonics 2006, pp.0
- Issued Date
- 2006-08-15
- Conference Place
- US
- Appears in Collections:
- Department of Materials Science and Engineering > 2. Conference Papers
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