OAK

Nano-scale patterning using coherent hard x-rays

Metadata Downloads
Author(s)
NOH, DO YOUNG
Type
Conference Paper
Citation
The 6th workshop on X-ray and Neutron scattering technology for surface nano-characterization 2008
Issued Date
2008-12-11
Publisher
포항가속기연구소
Conference Place
KO
URI
https://scholar.gist.ac.kr/handle/local/25993
Authorize & License
  • Authorize공개
Files in This Item:
  • There are no files associated with this item.

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.