OAK

Nano-scale patterning using coherent hard x-rays

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Author(s)
NOH, DO YOUNG
Type
Conference Paper
Citation
The 6th workshop on X-ray and Neutron scattering technology for surface nano-characterization 2008
Issued Date
2008-12-11
Publisher
포항가속기연구소
Conference Place
KO
URI
https://scholar.gist.ac.kr/handle/local/25993
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