OAK

Far-field diffraction 방법을 이용한 PPLN 소자의 품질 분석

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Author(s)
고도경
Type
Conference Paper
Citation
한국광학회 제 23회 정기총회 및 2012년도 동계 학술발표회
Issued Date
2012-02-09
Publisher
한국광학회
Conference Place
KO
URI
https://scholar.gist.ac.kr/handle/local/23918
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