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GIST Scholar College of Information and Computing Department of Electrical Engineering and Computer Science 2. Conference Papers

High quality depth map up-sampling with consideration for edge noise of range sensors

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Author(s)
YOON, KUK JIN
Type
Conference Paper
Citation
IEEE International Conference on Image Processing (ICIP)
Issued Date
2012-09
Publisher
IEEE
Conference Place
US
URI
https://scholar.gist.ac.kr/handle/local/23592
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