GIST Scholar
College of Engineering
Department of Materials Science and Engineering
2. Conference Papers
Threshold voltage instability of ZnO nanowire FET influenced by gate dielectrics
- Type
- Conference Paper
- Citation
- International Conference on Electronic Materials and Nanotechnology for Green Environment 2012 (ENGE 2012)
- Issued Date
- 2012-09-18
- Publisher
- International Conference on Electronic Materials and Nanotechnology for Green Environment 2012 (ENGE 2012)
- Conference Place
- KO
- Appears in Collections:
- Department of Materials Science and Engineering > 2. Conference Papers
- 파일 목록
-
-
관련 파일이 존재하지 않습니다.
-
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.