OAK

라이다의 광각 고해상도 측정을 위한 왕복 방식 스캐닝 분석

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Author(s)
Cho, Youngjun; Hong, Jinseo; Park, Kyihwan
Type
Conference Paper
Citation
제34회 정기총회 및 2023년도 동계학술발표회
Issued Date
2023-02-15
Publisher
한국광학회
Conference Place
KO
부산
URI
https://scholar.gist.ac.kr/handle/local/21718
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