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First-principles study on electronic structure of Si/SiO2 interface - Effect of defect position

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Author(s)
Junsung ParkHong, Sung-Min
Type
Conference Paper
Citation
Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices
Issued Date
2017-07-05
Publisher
The Institute of Electronics and Information Engineers
Conference Place
KO
URI
https://scholar.gist.ac.kr/handle/local/20272
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