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Structural properties of CdO layers grown on GaAs (001) substrates by metalorganic molecular beam epitaxy

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Abstract
Transmission electron microscopy (TEM) and transmission electron diffraction (TED) examination has been made to investigate the microstructural behaviour of rock-salt CdO layers grown on (0 0 1) GaAs substrates with two different buffer layers of ZnS and ZnO/ZnS. It is shown that the CdO layer grown on the ZnS buffer layer has epitaxial relationship to the GaAs substrate, even though a low density of CdO nano-crystallites (18-25 nm across) are formed at the CdO/ZnS interface region. TEM and TED results show that the CdO layer grown on the ZnO/ZnS buffer layer is polycrystalline. TED results also show that the ZnO buffer layer is polycrystalline with a mixture of wurtzite and zinc-blende phases, which results in the formation of polycrystalline CdO layers. (C) 2003 Published by Elsevier Science B.V.
Author(s)
Kim, Bong-JoongOk, YWSeong, Tae YeonAshrafi, ABMAKumano, HSuemune, I
Issued Date
2003-05
Type
Article
DOI
10.1016/S0022-0248(02)02521-6
URI
https://scholar.gist.ac.kr/handle/local/18367
Publisher
Elsevier BV
Citation
Journal of Crystal Growth, v.252, no.1-3, pp.219 - 225
ISSN
0022-0248
Appears in Collections:
Department of Materials Science and Engineering > 1. Journal Articles
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