OAK

Circuit fabrication at 17 nm half-pitch by nanoimprint lithography

Metadata Downloads
Author(s)
Jung, Gun Young; Johnston-Halperin, E.; Wu, W.; Yu, Z.; Wang, S.-Y.; Tong, W.M.; Li, Z.; Green, J.E.; Sheriff, B.A.; Boukai, A.; Bunimovich, Y.; Heath, J.R.; Williams, R.S.
Type
Article
Citation
NANO LETTERS, v.6, no.3, pp.351 - 354
Issued Date
2006-03
Abstract
High density metal cross bars at 17 nm half-pitch were fabricated by nanoimprint lithography. Utilizing the superlattice nanowire pattern transfer technique, a 300-layer GaAs/AlGaAs superlattice was employed to produce an array of 150 Si nanowires (15 nm wide at 34 nm pitch) as an imprinting mold. A successful reproduction of the Si nanowire pattern was demonstrated. Furthermore, a cross-bar platinum nanowire array with a cell density of approximately 100 Gbit/cm 2 was fabricated by two consecutive imprinting processes. © 2006 American Chemical Society.
Publisher
AMER CHEMICAL SOC
ISSN
1530-6984
DOI
10.1021/nl052110f
URI
https://scholar.gist.ac.kr/handle/local/17939
공개 및 라이선스
  • 공개 구분공개
파일 목록
  • 관련 파일이 존재하지 않습니다.

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.