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Reversible switching characteristics of polyfluorene-derivative single layer film for nonvolatile memory devices

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Abstract
This letter reports on reversible switching behavior of metal-insulator-metal type nonvolatile organic memory devices using polyfluorene-derivative (WPF-oxy-F) single layer film. The current-voltage (I-V) characteristics showed that the WPF-oxy-F single layer film has two distinguished resistance states, low resistance state and high resistance state, with four orders of on/off ratio (I(on)/I(off)similar to 10(4)). From the analysis of I-V curves, area dependent I-V characteristics, and current images obtained by conducting atomic force microscopy we propose that the space charge limited current with filamentary conduction is a potential mechanism for the reversible switching behavior of WPF-Oxy-F memory devices. (c) 2008 American Institute of Physics.
Author(s)
Kim, Tae-WookOh, Seung-HwanChoi, HyejungWang, GunukHwang, HyunsangKim, Dong-YuLee, Takhee
Issued Date
2008-06
Type
Article
DOI
10.1063/1.2952825
URI
https://scholar.gist.ac.kr/handle/local/17355
Publisher
American Institute of Physics
Citation
Applied Physics Letters, v.92, no.25, pp.253308
ISSN
0003-6951
Appears in Collections:
Department of Materials Science and Engineering > 1. Journal Articles
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