Reversible switching characteristics of polyfluorene-derivative single layer film for nonvolatile memory devices
- Abstract
- This letter reports on reversible switching behavior of metal-insulator-metal type nonvolatile organic memory devices using polyfluorene-derivative (WPF-oxy-F) single layer film. The current-voltage (I-V) characteristics showed that the WPF-oxy-F single layer film has two distinguished resistance states, low resistance state and high resistance state, with four orders of on/off ratio (I(on)/I(off)similar to 10(4)). From the analysis of I-V curves, area dependent I-V characteristics, and current images obtained by conducting atomic force microscopy we propose that the space charge limited current with filamentary conduction is a potential mechanism for the reversible switching behavior of WPF-Oxy-F memory devices. (c) 2008 American Institute of Physics.
- Author(s)
- Kim, Tae-Wook; Oh, Seung-Hwan; Choi, Hyejung; Wang, Gunuk; Hwang, Hyunsang; Kim, Dong-Yu; Lee, Takhee
- Issued Date
- 2008-06
- Type
- Article
- DOI
- 10.1063/1.2952825
- URI
- https://scholar.gist.ac.kr/handle/local/17355
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