Self-referenced spectral interferometry for simultaneous measurements of thickness and refractive index

Abstract

We present a method for simultaneously measuring the thickness and the group refractive index of a specimen using self-referenced spectral-domain fiber-based interferometry. By removing the scanning part and using the fiber-based configuration, the system complexity and stability could be significantly improved. To minimize the system drift, we utilized the signals originated from the fiber ends of both arms. Implementing in a self-referenced configuration, we could improve the measurement accuracy down to a decimal place. Experimental measurements were made with a 1.555mm thick fused silica plate. At 814 nm the thickness was measured as 1.5546 +/- 0.0002 mm, and at the same time, the group index was obtained as 1.4627 +/- 0.0002. (C) 2009 Optical Society of America